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nathanael.allison@xcounter.com

+46 8 622 23 00

Weld Integrity

Detect at the physical limits of sources for imaging through the largest material thicknesses and at the smallest micron level analysis.

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Working to Ensure the Integrity of Welds and Joints

The superior performance of our detectors and their modular 3-side buttable detector design makes them ideal for all types of weld integrity testing ranging from large LNG tanks to small component welds and welds on exotic materials.

With weld and joint failure often being one of the significant causes of many diverse engineering incidents, the non-destructive inspection of welds is critical in ensuring longevity of many engineering systems; be it through preventative maintenance or construction phase examination. The current limited performance of flat panel X-ray detectors often places constraints on the thickness of material that can be examined. XCounter’s direct conversion CdTe detectors, with their market leading sensitivity open up the ability to examine large gauge materials at new levels of image resolution.

For example, our photon counting detectors provide solutions for large diameter, thick-walled pipe weld investigations without the need to use panoramic X-ray sources in the centre of the pipe; something that can often be difficult to manage on long pipe systems and in-field applications. The ability to detect essentially every photon that passes through the pipe means that XCounter detectors can be used in diametrically opposed source-to-detector configurations in systems where older detector technology would fail.

The adaptability of our Our XC-Flite X1 and PDT25-DE detectors allow simple fitting onto existing weld investigation systems with minimum impact due to their light weight and small size. And our standard software packages facilitate the ability to develop easy to use capture-and-image GUI solutions for robust field based inspection.

Market Leading Performance for Challenging Weld Examination

All of the XCounter detectors outperform most TFT based flat panel detectors with Detector Quantum Efficiency (DQE) of 85% @ RQA5 spectra and a Modulation Transfer Function (MTF) of >80% @ 2lp/mm.

Examining pipe welds in thick materials requires that the source X-rays need to be of high enough energy to pass through the subject. The CdTe CMOS direct conversion technology of XCounter detectors with its high X-ray absorption capability make it ideal for high energy X-ray analysis. Combining this stopping power and our proprietary software of CSC (Charge Sharing Correction) that enhances our detectors to levels of resolution and sensitivity that cannot be achieved in any other technology, only a few individual photons are needed to pass through the weld to generate image data. And with zero dark noise, our detectors can operate for long periods of time maximising the chance of accumulating photon data with no negative impact on output quality.

Our unparalleled Dynamic range gives the opportunity so see all of an object in one exposure and presents more data for analysis. With frame rates of up to 20,000 fps this occurs in as quick a time as possible. Such capability presents solutions for large equipment weld examination and fast response Weld integrity Quality Control.

Explore our Gallery for examples of our image performance.

Technology

XCounter has a solid foundation in both integrating and photon counting state of the art x-ray detector technology.

The basic component in our detectors are a conversion material, which converts the x-rays into electrical signals, and a CMOS (ASIC) which transforms the electric signals into a datastream of either the integrated electric charge or the number of photons which has entered each pixel. This data is then used to create a digital image which is either two- or threedimensional, depending on the scan geometry.

Our solid state detector uses CdTe which is a direct conversion material. When an x-ray photon enters the material it is converted directly to an electric signal which is captured, measured and finally processed into an image. This provides significantly better MTF (Modulation Transfer Function) and DQE (Detection Quantum Efficiency) compared to scintillation detectors due to the high sensitivity and very good stopping power for high energy photons. By combining the CdTe conversion layer with our custom ASICs (CMOS) we can supply detectors that support integrating as well as photon counting modes, fast readout and low power consumption.